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Joint Test Action Group
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#	Item
661	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for February 22nd, 2005 9:00AM-11:00AM Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2005-05-15 15:47:48 Boundary scan Joint Test Action Group Information Processing Language Cell Battery Electronics manufacturing Electronics Technology
662	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for October 20th, 2005 8:00AM-9:45AM Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-06-13 17:20:20 Technology Boundary scan Joint Test Action Group Cell Electronics manufacturing Manufacturing Electronics
663	Implementing and Using a Mixed-Signal Test Bus Stephen Sunter [removed] Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2004-11-27 10:19:57 Manufacturing Electronic design Integrated circuits Embedded systems Joint Test Action Group Boundary scan Digital electronics IC power supply pin Integrated circuit design Electronic engineering Electronics Electronics manufacturing
664	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for September 25th, [removed]:00 – 1:00 PM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2008-09-29 08:00:46 Software Cron Bracket Joint Test Action Group Minutes Boundary scan C Computing Electronics manufacturing Electronics
665	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for October 25th, [removed]PM -5 PM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2008-01-08 21:21:19 IEEE standards Joint Test Action Group Alexandre Rousselin de Saint-Albin Cron Minutes Technology Electronics manufacturing Computing Electronics
666	Microsoft Word - TE[removed]R1_Edited_New.doc Add to Reading List Source URL: yuba.stanford.edu Language: English - Date: 2008-07-14 21:23:53 Networking hardware IEEE standards Embedded systems Internet NetFPGA Field-programmable gate array Ethernet Computer network Joint Test Action Group Electronics Computing Electronic engineering
667	Breakthrough silicon scanning discovers backdoor in military chip Sergei Skorobogatov1 and Christopher Woods2 1 University of Cambridge, Computer Laboratory, Cambridge, UK Add to Reading List Source URL: www.cl.cam.ac.uk Language: English - Date: 2012-09-13 11:41:35 Electronics manufacturing Manufacturing Digital electronics Microcontrollers Joint Test Action Group Field-programmable gate array Boundary scan TI MSP430 Actel Electronic engineering Electronics Embedded systems
668	[removed]Working Group meeting ITC’05 Nov 7, 2005 Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-06-13 17:25:40 IEEE standards Electronics manufacturing Joint Test Action Group Sunter Cron Technology Computing Electronics Embedded systems
669	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for May, 23rd[removed]:00AM-11:00AM Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-06-13 17:20:20 Electronics manufacturing Joint Test Action Group Technology
670	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for October 16th, [removed]AM – 9 AM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-11-02 10:48:34 Joint Test Action Group Business Technology Meetings Minutes Parliamentary procedure

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